Integrated circuit failure analysis [electronic resource] : a guide to preparation techniques / Friedrich Beck ; translated by Stephen S. Wilson.
By: Beck, Friedrich
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Material type: 
TextSeries: Wiley series in quality and reliability engineering: Publisher: Chichester ; New York : Wiley, c1998General Notes: Available through the EBSCO e-book Collection, which can be found on the Davenport University Library database page.Bibliography: Includes bibliographical references and index.Description: 1 online resource (xiv, 173 p.) : ill.ISBN: 0585269467 (electronic bk.); 9780585269467 (electronic bk.).Uniform titles: Präparationstechniken für die Fehleranalyse an integrierten Halbleiterschaltungen. English Subject(s): Semiconductors -- Failures | Semiconductors -- TestingGenre/Form: Electronic books DDC classification: 621.3815 Online resources: Access full-text materials at no charge:
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
| E-book | Davenport Library e-book | E-book | 621.3815 (Browse shelf(Opens below)) | Not For Loan | mq290952 |
Includes bibliographical references and index.
Available through the EBSCO e-book Collection, which can be found on the Davenport University Library database page.
Description based on print version record.
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