Normal view MARC view

Entry Topical Term

Number of records used in: 1

001 - CONTROL NUMBER

  • control field: 60752

003 - CONTROL NUMBER IDENTIFIER

  • control field: OSt

005 - DATE AND TIME OF LATEST TRANSACTION

  • control field: 20191028104957.0

008 - FIXED-LENGTH DATA ELEMENTS

  • fixed length control field: 861027i| anannbab| |a ana

010 ## - LIBRARY OF CONGRESS CONTROL NUMBER

  • LC control number: sh 86006952

035 ## - SYSTEM CONTROL NUMBER

  • System control number: 284501
  • Canceled/invalid system control number: sh86006952

040 ## - CATALOGING SOURCE

  • Original cataloging agency: DLC
  • Transcribing agency: DLC
  • Modifying agency: DLC

053 ## - LC CLASSIFICATION NUMBER

  • Classification number element--single number or beginning number of span: TK7871.852

150 ## - HEADING--TOPICAL TERM

  • Topical term or geographic name entry element: Semiconductors
  • General subdivision: Failures

450 ## - SEE FROM TRACING--TOPICAL TERM

  • Topical term or geographic name entry element: Failures in semiconductors

670 ## - SOURCE DATA FOUND

  • Source citation: Work cat.: Amerasekera, E.A. Failure mechanisms in semiconductor devices, 1987.

670 ## - SOURCE DATA FOUND

  • Source citation: ASTI, 1985
  • Information found: (Semiconductors--Failure)

675 ## - SOURCE DATA NOT FOUND

  • Source citation: TEST

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